HomeElectronicsSiC JFETs improve system reliability underneath stress

SiC JFETs improve system reliability underneath stress



SiC JFETs improve system reliability underneath stress

CoolSiC JFETs from Infineon present low conduction losses and sturdy turn-off conduct for solid-state safety and energy distribution. Their robust short-circuit functionality, linear-mode thermal stability, and correct overvoltage management make them well-suited for solid-state circuit breakers, automotive battery disconnect switches, and industrial security relays.

The majority-channel optimized JFETs provide RDS(on) values as little as 1.5 mΩ for 750 V units and a pair of.3 mΩ for 1200 V variants. Housed in a top-side cooled Q-DPAK, they allow easy paralleling and scalable present dealing with. Constant switching efficiency underneath thermal stress and fault circumstances ensures dependable operation in demanding environments.

Engineering samples of the brand new CoolSiC JFET units can be obtainable in late 2025, with quantity manufacturing starting in 2026. The portfolio will broaden to incorporate a spread of packages and modules. For extra info, click on right here.

Infineon Applied sciences 

The publish SiC JFETs improve system reliability underneath stress appeared first on EDN.

RELATED ARTICLES

LEAVE A REPLY

Please enter your comment!
Please enter your name here

- Advertisment -
Google search engine

Most Popular

Recent Comments