HomeElectronicsMEMS tech speeds automotive Ethernet fault exams

MEMS tech speeds automotive Ethernet fault exams



MEMS tech speeds automotive Ethernet fault exams

Fitted with MEMS switches, two fault insertion items (FIUs) from Pickering simulate widespread faults in MultiGBASE-T1 communication hyperlinks. The only-slot 40-205 (PXI) and 42-205 (PXIe) modules goal automotive hardware-in-the-loop simulation, enabling design verification of networking elements comparable to ADAS controllers at knowledge charges as much as 10 Gbps.

Each PXI and PXIe modules present 4 or 8 channels of impedance-matched, two-wire sign paths that help communication protocols from legacy 10BASE-T1 to the 10GBASE-T1 automotive Ethernet customary. The FIUs assist confirm secure and constant controller operation underneath a spread of connectivity faults, together with open and brief circuits.

Leveraging MEMS know-how, the sign channels ship low insertion loss and VSWR, together with secure RF efficiency past 6 GHz. Quick 50-µs switching boosts check throughput, whereas the 3-billion-cycle lifetime ensures sturdiness. Every channel handles as much as 0.5 A and 100 V between wire pairs, and the 1.6-A fault buses enable a number of channels to share the identical fault situation.

The 8-channel 40-205 (PXI) and 42-205 (PXIe) FIU modules are priced at $10,995 every.

40/42-205 product web page 

Pickering Interfaces 

The publish MEMS tech speeds automotive Ethernet fault exams appeared first on EDN.

RELATED ARTICLES

LEAVE A REPLY

Please enter your comment!
Please enter your name here

- Advertisment -
Google search engine

Most Popular

Recent Comments