HomeNanotechnologyNovel method reveals true habits of next-generation MXenes

Novel method reveals true habits of next-generation MXenes


Novel method reveals true habits of next-generation MXenes

by Erica Marchand

Paris, France (SPX) Oct 07, 2025






Researchers have, for the primary time, measured the intrinsic properties of particular person MXene flakes – an rising nanomaterial with promise for power storage, electronics, and clear applied sciences – utilizing a brand new light-based technique referred to as spectroscopic micro-ellipsometry (SME). The invention offers essential insights into how MXenes perform on the nanoscale, probably reworking how these supplies are designed and deployed in superior units.



MXenes (pronounced max-eens) are ultra-thin supplies just a few atoms thick, prized for his or her capacity to conduct electrical energy, retailer power, and work together with mild. But, most earlier research examined MXenes as stacked skinny movies composed of many overlapping flakes, obscuring the true behaviors of particular person layers.



“Measuring how single MXene flakes depolarize mild enabled us to pinpoint structural intra-flake variations in thickness on the nano stage,” defined Dr. Andreas Furchner of Helmholtz-Zentrum Berlin (HZB). “We had been excited to see how properly the outcomes match damaging methods like STEM.”



The examine, led by Dr. Furchner in collaboration with Dr. Ralfy Kenaz from the Hebrew College of Jerusalem’s Institute of Physics, unites the experience of two main analysis groups: Dr. Tristan Petit’s group at HZB and Prof. Ronen Rapaport’s group at Hebrew College. Collectively, they developed SME – a patented method that acts as a form of optical fingerprinting – to measure the optical, structural, and digital properties of single MXene flakes with excessive precision and with out inflicting harm.



Standard ellipsometry, a cornerstone of supplies characterization, can not measure areas smaller than 50 microns, making it unsuitable for nanoscale constructions. SME overcomes that barrier by shining mild with outlined polarization states onto microscopic flakes, then analyzing how the mirrored mild adjustments. From these reflections, researchers mapped the conductivity and optical habits of particular person flakes, revealing that thinner MXenes have greater electrical resistance – an important think about constructing secure, high-performance units.



“What is really excellent with this work is that in lower than one minute, we are able to instantly measure the optical properties, thickness, structural properties, and conductivity of particular person MXene flakes – all in a non-destructive method,” stated Dr. Kenaz, co-inventor of the SME method. “Usually, these measurements require three totally different devices, are time-consuming and damaging, and ultimately, not as dependable as spectroscopic micro-ellipsometry.”



Dr. Petit of Helmholtz-Zentrum Berlin famous that the method opens the door to real-time supplies monitoring: “This permits operando characterization that was beforehand solely potential with synchrotron-based methods comparable to scanning transmission X-ray microscopy. We now have a lab-based, high-throughput technique to check how MXenes evolve in numerous environments.”



MXenes are being investigated to be used in ultrafast batteries, photo voltaic cells, water filtration, and versatile electronics. Understanding how their intrinsic properties change with thickness or publicity circumstances is vital to optimizing these purposes.



“This work offers a roadmap for integrating MXenes into actual applied sciences by providing a direct view of their intrinsic properties, with out interference from stacked layers or impurities,” stated Prof. Rapaport. “By refining how we examine these supplies utilizing our SME method, we’re paving the best way for his or her use in optoelectronic units, power options, and past.”



The breakthrough not solely clarifies how MXenes behave on the atomic stage but additionally establishes spectroscopic micro-ellipsometry as a strong new software for analyzing 2D supplies. As Dr. Petit emphasised, “It is a highly effective demonstration of how worldwide collaboration and superior physics can speed up supplies science. MXenes are just the start.”



Analysis Report:Optical, Structural, and Cost Transport Properties of Particular person Ti3C2Tx MXene Flakes through Micro-Ellipsometry and Past


Associated Hyperlinks

Hebrew College of Jerusalem

Nano Expertise Information From SpaceMart.com
Laptop Chip Structure, Expertise and Manufacture



RELATED ARTICLES

LEAVE A REPLY

Please enter your comment!
Please enter your name here

- Advertisment -
Google search engine

Most Popular

Recent Comments